The "X-TIP" STRP is targeted at exploring the frontiers of knowledge by introducing new
types of experimental techniques suitable for the investigation of nano-sized materials.
The proposed new instrumentation, based on a combination of Local Probe Microscopies (LPM)
such as Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM) and
Scanning Near-field Optical Microscopy (SNOM) with X-Ray Spectromicroscopy (XRS),
will provide chemical-specific contrast at unprecedented lateral resolution of up
to 10-40 nanometers, thus overcoming existing limitations of the two (LPM and XRS)
methods and opening a wide range of research opportunities and challenges.
The overall objectives of the "X-TIP" STRP are:
- developing novel handling and control devices and instruments for future
nano-technology by combining Local Probe Microscopies (STM, AFM, SNOM) with
Synchrotron Radiation X-ray Absorption Spectroscopy;
- introducing new methodologies for 3D-surface chemical mapping and for
structural characterization of nanostructures by Nano-scale X-Ray Absorption Spectromicroscopy;
- bringing together Europe's leading scientists with the purpose of creating
a bridge from fundamental research into future industrial exploitation.
The proposed methodologies represent a complex approach to the problem of chemical
and structural analysis at the nano-scale level and imply the integration of many
different skills. As a result, we expect to deliver techniques with improved lateral
resolution in respect to a microprobe. They will be of direct interest to nano-science but
also to other target areas of the European Union, e.g. the fight against fraud, cultural and
artistic heritage, preservation of buildings, etc.
|WP1: SR-TIP-OPTIC - Alignement, monitoring and pinning of Synchrotron Radiation beam on tip (STP, AFM, SNOM) area.
||ESRF, OGG-INFM, LEPES, UNITN, IFN-CNR
|WP2: XAS-SNOM - Element-Specific Contrast in Local Probe Microscopy via X-ray excited optical luminescence (XEOL) detection by optical probe in SNOM mode.
||GPEC, UNITN, IFN-CNR, ISSP, ESRF, UNITA
|WP3: XAS-STM - Element-Specific Contrast in Local Probe Microscopy via X-ray excited photoelectrons detection by conductive tip in STM mode.
||OGG-INFM, ESRF, LEPES, ISSP, GPEC, UNITA
| WP4: XAS-AFM - Element-Specific Contrast in Local Probe Microscopy via X-ray induced changes in capacitance by conductive tip in AFM mode.
||ISSP, GPEC, LEPES, ESRF, UNITA
|WP5: SR-STM/AFM - in-situ combination of tip surface interaction and Synchrotron Radiation (SR): XDR-AFM.
||LEPES, ISSP, GPEC, ESRF, UNITA