The "X-TIP" STRP is targeted at exploring the frontiers of knowledge by introducing new types of experimental techniques suitable for the investigation of nano-sized materials. The proposed new instrumentation, based on a combination of Local Probe Microscopies (LPM) such as Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM) and Scanning Near-field Optical Microscopy (SNOM) with X-Ray Spectromicroscopy (XRS), will provide chemical-specific contrast at unprecedented lateral resolution of up to 10-40 nanometers, thus overcoming existing limitations of the two (LPM and XRS) methods and opening a wide range of research opportunities and challenges.

The overall objectives of the "X-TIP" STRP are:

• developing novel handling and control devices and instruments for future nano-technology by combining Local Probe Microscopies (STM, AFM, SNOM) with Synchrotron Radiation X-ray Absorption Spectroscopy;
• introducing new methodologies for 3D-surface chemical mapping and for structural characterization of nanostructures by Nano-scale X-Ray Absorption Spectromicroscopy;
• bringing together Europe's leading scientists with the purpose of creating a bridge from fundamental research into future industrial exploitation.

The proposed methodologies represent a complex approach to the problem of chemical and structural analysis at the nano-scale level and imply the integration of many different skills. As a result, we expect to deliver techniques with improved lateral resolution in respect to a microprobe. They will be of direct interest to nano-science but also to other target areas of the European Union, e.g. the fight against fraud, cultural and artistic heritage, preservation of buildings, etc.